Show simple item record

dc.contributor.authorBondanini, Giorgia
dc.contributor.authorGiorgi, Gabriele
dc.contributor.authorAriza-Montes, Antonio
dc.contributor.authorVega-Muñoz, Alejandro
dc.contributor.authorAndreucci-Annunziata, Paola
dc.date.accessioned2020-11-09T20:54:00Z
dc.date.available2020-11-09T20:54:00Z
dc.date.issued2020-11-01
dc.identifier10.3390/ijerph17218013
dc.identifier.issn16617827
dc.identifier.urihttps://hdl.handle.net/20.500.12728/7121
dc.description.abstractThis article aims to provide a critical review of the scientific research on technostress. As such, global references in this field are identified and highlighted in order to manage pre-existing knowledge and establish future ‘bridges’ among researchers, and to enhance the presently dispersed understanding of this subject. A scientometric meta-analysis of publications on technostress was conducted to achieve this objective. Mainstream journals from the Web of Science (WoS) were used to identify current topics, relevant journals, prolific authors, institutions, and countries, ‘schools of thought’ and the thematic areas around which current technostress debate revolves. In this article a significant contribution comes from the use of the scientific activity itself, together with scientometric meta-analysis techniques and the application of this scientific activity, its impact and relational character, to discover relevant countries, research organizations and authors which can constitute a global reference to demarcate this knowledge frontier, and who lead the ‘critical mass’ of global technostress researchers. This study also distinguishes between the relevant themes studied, with co-keywords plus bibliographic coupling citation, and examines the kind of stress the most prolific authors have considered and, therefore, to discover those topics which should be studied further to deepen this research field, in search of a post-disciplinary knowledge that allows unity of focus in technology and psychology.es_ES
dc.language.isoenes_ES
dc.publisherMDPI AGes_ES
dc.subjectDark sidees_ES
dc.subjectInformation overloades_ES
dc.subjectInformation-technologyes_ES
dc.subjectMental healthes_ES
dc.subjectScientometricses_ES
dc.subjectTechnostresses_ES
dc.subjectWorkes_ES
dc.titleTechnostress dark side of technology in the workplace: a scientometric analysises_ES
dc.typeArticlees_ES


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record